SPICE-compatible floating-dot single-electron memory model with a new description of SOI MOSFETs including quantum-mechanical effects
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作者:
Yu, YS
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机构:
Hankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, South KoreaHankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, South Korea
Yu, YS
[1
]
Kim, SH
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机构:Hankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, South Korea
Kim, SH
Choi, BH
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机构:Hankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, South Korea
Choi, BH
Hong, SH
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机构:Hankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, South Korea
Hong, SH
Hwang, SW
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机构:Hankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, South Korea
Hwang, SW
Ahn, D
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机构:Hankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, South Korea
Ahn, D
机构:
[1] Hankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, South Korea
[2] Korea Univ, Dept Elect & Comp Engn, Seoul 136701, South Korea
single-electron memory;
SPICE;
single-electron Box;
SOI MOSFET;
D O I:
暂无
中图分类号:
O4 [物理学];
学科分类号:
0702 ;
摘要:
We introduce a SPICE-compatible model for a floating-dot single-electron memory (FDSEM), which includes both the single-electron box (SEB) model and the modified SOI MOSFET model. In this model, a surface potential model for SOI devices is developed. The accuracy of the developed model is verified with experimental data from FDSEM devices.