Nano-scale analytical characterization of engineering materials by transmission electron microscopy

被引：0
|
作者：
Epicier, T
Cheynet, MC
Martin, JM
机构：
[1] Inst Natl Sci Appl, GEMPPM, UMR 5510, CNRS, F-69621 Villeurbanne, France
[2] INPG ENSEEG, LTPCM, CNRS, UMR 5614, F-38042 Grenoble, France
[3] Ecole Cent Lyon, LTDS, CNRS, UMR 5513, F-69131 Ecully, France
来源：
ADVANCED ENGINEERING MATERIALS | 2001年 / 3卷 / 08期
关键词：
D O I：
10.1002/1527-2648(200108)3:8<612::AID-ADEM612>3.0.CO;2-1
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：612 / 615
页数：4
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