Modeling and measurement of losses in silicon-on-insulator resonators and bends

被引:112
|
作者
Xiao, Shijun [1 ]
Khan, Maroof H. [1 ]
Shen, Hao [1 ]
Qi, Minghao [1 ]
机构
[1] Purdue Univ, Brick Nanotechnol Ctr, W Lafayette, IN 47907 USA
来源
OPTICS EXPRESS | 2007年 / 15卷 / 17期
关键词
D O I
10.1364/OE.15.010553
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present an analytical model to quantify losses in resonators and bends without uncertain contributions from fiber coupling in/out or waveguide cleavage facets. With resonators in add-drop configuration, intrinsic losses are calculated from the free spectral range, through-port extinction and drop-port bandwidth. We fabricated and characterized silicon-on-insulator resonator for loss analysis. At 1.55 mu m, racetrack resonators with a bending radius of 4.5 mu m show intrinsic losses as small as 0.14 +/- 0.014 dB/round-trip. Meanwhile, intrinsic losses increase up to 1.23 dB/ round-trip in the racetrack resonator that has a bending radius of 2.25 mu m. Losses in a 180 degrees bend are estimated as a half of the intrinsic losses in these racetrack resonators, i. e., 0.07 +/- 0.007 dB/ turn for a bending radius of 4.5 mu m and 0.62 dB/turn for a bending radius of 2.25 mu m. Loss in a 90o bend with a radius of 4.5 mu m is determined to be 0.06 +/- 0.006 dB/turn at 1.55 mu m. The losses in 180 degrees or 90 degrees bends are found to be mainly due to the transition loss between waveguide bends and straight waveguides.
引用
收藏
页码:10553 / 10561
页数:9
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