A review of high energy backscattering spectrometry

被引：2

作者：

Tesmer, JR ^{[1
]}

Maggiore, CJ ^{[1
]}

Nastasi, M ^{[1
]}

Barbour, JC ^{[1
]}

机构：

[1] SANDIA NATL LABS,ALBUQUERQUE,NM 87185

来源：

MATERIALS CHEMISTRY AND PHYSICS | 1996年 / 46卷 / 2-3期

关键词：

high energy backscattering spectrometry; resonances; applications;

D O I：

10.1016/S0254-0584(97)80013-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The technique and application of high-energy backscattering (HEBS) is reviewed in this paper. The advantages and limitations of the technique are discussed as well as the origins of the resonances in the cross sections which are fundamental for its application. Methods for determining the cross sections are presented including the fabrication of targets for measuring th cross sections. Applications for both alpha and proton HEBS are presented.

引用

页码：189 / 197

页数：9

共 50 条

[1] Development from Rutherford backscattering to high energy backscattering spectrometry
Tang, JY
Cheng, HS
Zhou, ZY
Yang, FJ
APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY - PROCEEDINGS OF THE FOURTEENTH INTERNATIONAL CONFERENCE, PTS 1 AND 2, 1997, (392): : 639 - 642
[2] HIGH-RESOLUTION MEDIUM-ENERGY BACKSCATTERING SPECTROMETRY
MENDENHALL, MH
WELLER, RA
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 59 : 120 - 123
[3] BACKSCATTERING SPECTROMETRY
MAYER, JW
NICOLET, MA
CHU, WK
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 356 - 356
[4] MULTILAYER ANALYSIS BY HIGH-RESOLUTION BACKSCATTERING SPECTROMETRY
HUDDLE, JR
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1989, 40-1 : 773 - 775
[5] A review of the direct determination of light elements by high-energy resonant backscattering.
Tesmer, JR
Maggiore, CJ
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1998, 215 : U968 - U968
[6] RUTHERFORD BACKSCATTERING SPECTROMETRY
PERRIERE, J
VACUUM, 1987, 37 (5-6) : 429 - 432
[7] HEAVY-ION BACKSCATTERING SPECTROMETRY FOR HIGH-SENSITIVITY
KNAPP, JA
BANKS, JC
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 79 (1-4): : 457 - 459
[8] Toward high accuracy in channeling Rutherford backscattering spectrometry analysis
Shao, Lin
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2008, 266 (06): : 961 - 964
[9] Low energy ion backscattering spectrometry of multi-layer targets
Klatt, C
Kalbitzer, S
Konac, G
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 136 : 153 - 158
[10] High accuracy traceable Rutherford backscattering spectrometry of ion implanted samples
Colaux, J. L.
Jeynes, C.
ANALYTICAL METHODS, 2014, 6 (01) : 120 - 129

← 1 2 3 4 5 →