Calculation and Analysis for the measurement of the focal length of lens in a Fizeau interferometer with combination lenses - art. no. 67232Y

被引：0

作者：

Yuan Jing ^{[1
]}

Ren Huan ^{[1
]}

Chen Bo ^{[1
]}

Xu Hua ^{[1
]}

Yang Yi ^{[1
]}

Tang Xiaoqing ^{[1
]}

Ma Yurong ^{[1
]}

Ma Ke ^{[1
]}

Yu Deqiang ^{[1
]}

Li Wenhong ^{[1
]}

Meng Wanguo ^{[1
]}

机构：

[1] Laser Fus REs Ctr CAEP, Sichuan Mianyang 621900, Peoples R China

来源：

3RD INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, PARTS 1-3 | 2007年 / 6723卷

关键词：

long focal length; measurement method; calculating formulae; optimization and error analysis;

D O I：

10.1117/12.783365

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In this paper, the measurement method of long focal length in a Fizeau interferometer with combination lenses is stated. According to the principle of geometry optics, two focal length calculation formulae are deduced for the measurement method. The optimization of measurement parameter values is analyzed, and the optimized values of measurement parameters are selected. By analyzing the measurement error of the focal length needed to be measured, the permitted error ranges of measurement parameters are obtained for the optimization of parameters so as to meet the requirement of measurement accuracy of focal length (+/-0.1%). By means of analysis, it is obtained that the measurement method can meet the requirement (+/-0.1%) of measurement accuracy of long focal length of high power laser Facility.

引用

页码：Y7232 / Y7232

页数：8

共 4 条

[1] Analysis of resolution criterion and aberrations for Fizeau interferometer - art. no. 68342G
Wang, Shengqian
Rao, Changhui
Jiang, Wenhan
OPTICAL DESIGN AND TESTING III, PTS 1 AND 2, 2008, 6834 : G8342 - G8342
[2] Optimum focal length range for thin-lens optical arrays providing spatial integration -: art. no. 033001
Kamal, H
Vázquez, D
Alda, J
OPTICAL ENGINEERING, 2005, 44 (03) : 1 - 10
[3] Calculation of axial charge spreading in carbon nanotubes and nanotube Y junctions during STM measurement -: art. no. 115423
Márk, GI
Biró, LP
Lambin, P
PHYSICAL REVIEW B, 2004, 70 (11) : 115423 - 1
[4] Analysis of array illumination generalized by the combination of a binary phase grating and a lens - art. no. 67235X
Wang Huai-sheng
3RD INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, PARTS 1-3, 2007, 6723 : X7235 - X7235

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