Characterization of CZT detectors grown from horizontal and vertical Bridgman.

被引：9
|
作者：
Hermon, H [1 ]
Schieber, M [1 ]
Goorsky, M [1 ]
Lam, T [1 ]
Meerson, E [1 ]
Yao, H [1 ]
Erickson, J [1 ]
James, RB [1 ]
机构：
[1] Hebrew Univ Jerusalem, IL-91904 Jerusalem, Israel
来源：
HARD X-RAY GAMMA-RAY AND NEUTRON DETECTOR PHYSICS II | 2000年 / 4141卷
关键词：
CZT; x-ray diffraction (XRD); horizontal Bridgman (HB); vertical high pressure Bridgman (VHPB); radiation detectors;
D O I：
10.1117/12.407580
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Various types of Cd1-xZnxTe (0.04 < x < 0.24) detector crystals grown by vertical high pressure Bridgman (VHPB), low pressure Bridgman (LPB) i.e. vertical ambient pressure Bridgman (VB), horizontal ambient pressure Bridgman (HB) and vapor grown crystals have been evaluated and compared. We have used the following methods in order to evaluate the CZT: 1) Triaxial crystal x-ray diffraction (TAD) for determination of the surface crystalline homogeneity, 2) Nuclear spectroscopic response of detectors and 3) Sensitivity to radiation from high flux x-rays for investigations of the suitability for x-ray digital imaging. Finally a comparison between the various methods of CZT crystal growth will be given.
引用
收藏
页码：186 / 193
页数：8
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