Characterization of Glitter Cosmetic Particles Using FT-IR Spectroscopy

被引:0
|
作者
Najjar, Kandyss [1 ,2 ]
Bridge, Candice M. [1 ,2 ]
机构
[1] Univ Cent Florida, Natl Ctr Forens Sci, Orlando, FL 32816 USA
[2] Univ Cent Florida, Dept Chem, Orlando, FL 32816 USA
关键词
ATR;
D O I
暂无
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
With the common knowledge of DNA and fingerprints being used as trace evidence in casework, many perpetrators attempt to mitigate the transfer of such evidence at a crime scene. However, since close personal attacks are common, it is necessary to account for the potential lack of such evidence that may associate a suspect to a crime scene by considering other potential evidence. One type of evidence that is commonly overlooked by offenders is that of cosmetic transfer. Specifically, glitter components from cosmetic products may potentially transfer from or onto an offender, the crime scene, or the victim. In this study, 36 glitter samples were analyzed using attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FT-IR) in an attempt to develop a characterization scheme to aid in the identification of glitter particles that may transfer during personal assaults. Samples were separated into six classes based on chemical composition, and various statistical methods were used to determine the potential to classify glitter particles. Results of the developed scheme showed great accuracy, with at least 99% classification rates using three cross validation models. The developed classification model provides a basis for further identification of unknown glitter samples collected from a potential crime scene.
引用
收藏
页码:30 / 37
页数:8
相关论文
共 50 条
  • [1] Characterization of glitter cosmetic particles using FT-IR spectroscopy
    [J]. Bridge, Candice M. (cbridge@ucf.edu), 2018, Advanstar Communications Inc. (33):
  • [2] Characterization of multilayered glitter particles using synchrotron FT-IR microscopy
    Vernoud, Laetitia
    Bechtel, Hans A.
    Martin, Michael C.
    Reffner, John A.
    Blackledge, Robert D.
    [J]. FORENSIC SCIENCE INTERNATIONAL, 2011, 210 (1-3) : 47 - 51
  • [3] CHARACTERIZATION OF SEMICONDUCTOR SILICON USING FT-IR SPECTROSCOPY
    KRISHNAN, K
    MUNDHE, RB
    [J]. PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 452 : 71 - 78
  • [4] RAPID COAL CHARACTERIZATION BY FT-IR SPECTROSCOPY
    FREDERICKS, PM
    OSBORN, PR
    SWINKELS, DAJ
    [J]. FUEL, 1984, 63 (01) : 139 - 141
  • [5] Characterization of archaeological findings by FT-IR spectroscopy
    Barilaro, D
    Barone, G
    Crupi, V
    Majolino, D
    [J]. SPECTROSCOPY, 2005, 20 (04) : 16 - +
  • [6] Characterization and identification of actinomycetes by FT-IR spectroscopy
    Haag, H
    Gremlich, HU
    Bergmann, R
    Sanglier, JJ
    [J]. JOURNAL OF MICROBIOLOGICAL METHODS, 1996, 27 (2-3) : 157 - 163
  • [7] DETERMINATION OF SHARE OF ADHESIVE ON PARTICLES WITH FT-IR SPECTROSCOPY
    Medved, Sergej
    Resnik, Joze
    [J]. WOOD RESEARCH, 2010, 55 (01) : 101 - 110
  • [8] SURFACE ANALYSIS USING FT-IR SPECTROSCOPY
    ISHIDA, H
    KOENIG, JL
    [J]. AMERICAN LABORATORY, 1978, 10 (03) : 33 - &
  • [9] SURFACE ANALYSIS USING FT-IR SPECTROSCOPY
    ISHIDA, H
    KOENIG, JL
    [J]. INTERNATIONAL LABORATORY, 1978, (MAY-): : 49 - &
  • [10] Wood biomass characterization by DSC or FT-IR spectroscopy
    Brys, Andrzej
    Brys, Joanna
    Ostrowska-Ligeza, Ewa
    Kaleta, Agnieszka
    Gornicki, Krzysztof
    Glowacki, Szymon
    Koczon, Piotr
    [J]. JOURNAL OF THERMAL ANALYSIS AND CALORIMETRY, 2016, 126 (01) : 27 - 35