Determination of the radiation resistance order of high explosives by the two dimensional correlation X-ray photoelectron spectroscopy

被引：3

作者：

Sui, Heliang ^{[1
]}

Hao, Xiaofei ^{[1
]}

Luo, Yiwei ^{[1
]}

Xu, Jinjiang ^{[1
]}

Zhong, Fachun ^{[1
]}

Xu, Ruijuan ^{[1
]}

机构：

[1] CAEP, Inst Chem Mat, Mianyang 621900, Peoples R China

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2017年 / 406卷

基金：

中国国家自然科学基金;

关键词：

2DXPS; Explosives; Radiation; Degradation; UV;

D O I：

10.1016/j.nimb.2017.01.037

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Two-dimensional X-ray photoelectron spectroscopy (2DXPS) was employed to obtain the radiation resistance order of, high explosives. Mixed hexanitrohexaazaisowurtzitane (CL-20) and 1,3,5-triamino-2,4,6-trinitrobenzene (TATB) were irradiated by X-ray radiation. The time-dependent N1s XPS spectra were collected. 2DXPS was used to analyze the variation of the binding energy peaks. The main degradation time of TATB was longer than that of CL-20. CL-20 changes occurred prior to that of TATB during radiation. These changes suggest that TATB exhibited higher radiation resistance property than CL-20. 2DXPS is a very useful method to distinguish the radiation resistance orders of materials. (C) 2017 Elsevier B.V. All rights reserved.

引用

页码：496 / 500

页数：5

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