Deep n-well MAPS in a 130 nm CMOS technology: Beam test results

被引：6

作者：

Neri, N. ^{[1
,2
]}

Avanzini, C. ^{[1
,2
]}

Batignani, G. ^{[1
,2
]}

Bettarini, S. ^{[1
,2
]}

Bosi, F. ^{[1
,2
]}

Ceccanti, M. ^{[1
,2
]}

Cenci, R. ^{[1
,2
]}

Cervelli, A. ^{[1
,2
]}

Crescioli, F. ^{[1
,2
]}

Dell'Orso, M. ^{[1
,2
]}

Forti, F. ^{[1
,2
]}

Giannetti, P. ^{[1
,2
]}

Giorgi, M. A. ^{[1
,2
]}

Gregucci, S. ^{[1
,2
]}

Mammini, P. ^{[1
,2
]}

Marchiori, G. ^{[1
,2
]}

Massa, M. ^{[1
,2
]}

Morsani, F. ^{[1
,2
]}

Paoloni, E. ^{[1
,2
]}

Piendibene, M. ^{[1
,2
]}

Profeti, A. ^{[1
,2
]}

Rizzo, G. ^{[1
,2
]}

Sartori, L. ^{[1
,2
]}

Walsh, J. ^{[1
,2
]}

Yurtsev, E. ^{[1
,2
]}

Lusiani, A. ^{[2
,3
]}

Manghisoni, M. ^{[4
,5
]}

Re, V. ^{[4
,5
]}

Traversi, G. ^{[4
,5
]}

Bruschi, M. ^{[6
,7
]}

Di Sipio, R. ^{[6
,7
]}

Fabbri, L. ^{[6
,7
]}

Giacobbe, B. ^{[6
,7
]}

Gabrielli, A. ^{[6
,7
]}

Giorgi, F. ^{[6
,7
]}

Pellegrini, G. ^{[6
,7
]}

Sbarra, C. ^{[6
,7
]}

Semprini, N. ^{[6
,7
]}

Spighi, R. ^{[6
,7
]}

Valentinetti, S. ^{[6
,7
]}

Villa, M. ^{[6
,7
]}

Zoccoli, A. ^{[6
,7
]}

Andreoli, C. ^{[5
,8
]}

Gaioni, L. ^{[5
,8
]}

Pozzati, E. ^{[5
,8
]}

Ratti, L. ^{[5
,8
]}

Speziali, V. ^{[5
,8
]}

Gamba, D. ^{[9
,10
]}

Giraudo, G. ^{[9
,10
]}

Mereu, P. ^{[9
,10
]}

机构：

[1] Univ Pisa, I-56100 Pisa, Italy

[2] INFN Pisa, Pisa, Italy

[3] Scuola Normale Super Pisa, Pisa, Italy

[4] Univ Bergamo, Bergamo, Italy

[5] INFN Pavia, Pavia, Italy

[6] Univ Bologna, I-40126 Bologna, Italy

[7] INFN Bologna, Bologna, Italy

[8] Univ Pavia, I-27100 Pavia, Italy

[9] Univ Turin, I-10124 Turin, Italy

[10] INFN Torino, Turin, Italy

[11] Univ Trento, Trento, Italy

[12] INFN Padova, Padua, Italy

[13] Univ Trieste, I-34127 Trieste, Italy

[14] INFN Trieste, Trieste, Italy

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2010年 / 623卷 / 01期

关键词：

Silicon pixel sensors; MAPS; Beam test; Deep n-well; Charged particle tracker; DETECTOR;

D O I：

10.1016/j.nima.2010.02.193

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We report on recent beam test results for the APSEL4D chip, a new deep n-well MAPS prototype with a full in-pixel signal processing chain obtained by exploiting the triple well option of the CMOS 0.13 mu m process. The APSEL4D chip consists of a 4096 pixel matrix (32 rows and 128 columns) with 50 x 50 mu m(2) pixel cell area, with custom readout architecture capable of performing data sparsification at pixel level. APSEL4D has been characterized in terms of charge collection efficiency and intrinsic spatial resolution under different conditions of discriminator threshold settings using a 12 GeV/c proton beam in the T9 area of the CERN PS. We observe a maximum hit efficiency of 92% and we estimate an intrinsic resolution of about 14 mu m. The data driven approach of the tracking detector readout chips has been successfully used to demonstrate the possibility to build a Level 1 trigger system based on associative memories. The analysis of the beam test data is critically reviewed along with the characterization of the device under test. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：195 / 197

页数：3

共 50 条

[1] Development of Deep N-Well MAPS in a 130 nm CMOS Technology and Beam Test Results on a 4k-Pixel Matrix with Digital Sparsified Readout
Rizzo, G.
Avanzini, C.
Batignani, G.
Bettarini, S.
Bosi, F.
Calderini, G.
Ceccanti, M.
Cenci, R.
Cervelli, A.
Crescioli, F.
Dell'Orso, M.
Forti, F.
Giannetti, P.
Giorgi, M. A.
Lusiani, A.
Gregucci, S.
Mammini, P.
Marchiori, G.
Massa, M.
Morsani, F.
Neri, N.
Paoloni, E.
Piendibene, M.
Sartori, L.
Walsh, J.
Yurtsev, E.
Manghisoni, M.
Re, V.
Traversi, G.
Bruschi, M.
Di Sipio, R.
Giacobbe, B.
Gabrielli, A.
Giorgi, F.
Pellegrini, G.
Sbarra, C.
Semprini, N.
Spighi, R.
Valentinetti, S.
Villa, M.
Zoccoli, A.
Andreoli, C.
Gaioni, L.
Pozzati, E.
Ratti, L.
Speziali, V.
Gamba, D.
Giraudo, G.
Mereu, P.
Betta, G. F. Dalla
2008 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (2008 NSS/MIC), VOLS 1-9, 2009, : 2517 - +
[2] Status and perspectives of deep N-well 130nm CMOS MAPS
Re, Valerio
JOURNAL OF INSTRUMENTATION, 2009, 4
[3] Beam test results of different configurations of deep N-well MAPS matrices featuring in pixel full signal processing
Paoloni, E.
Avanzini, C.
Batignani, G.
Bettarini, S.
Bosi, F.
Calderini, G.
Casarosa, G.
Ceccanti, M.
Cenci, R.
Cervelli, A.
Crescioli, F.
Dell'Orso, M.
Forti, F.
Giannetti, P.
Giorgi, M. A.
Lusiani, A.
Gregucci, S.
Mammini, P.
Marchiori, G.
Massa, M.
Morsani, F.
Neri, N.
Piendibene, M.
Profeti, A.
Rizzo, G.
Sartori, L.
Walsh, J.
Yurtsev, E.
Manghisoni, M.
Re, V.
Traversi, G.
Bruschi, M.
Di Sipio, R.
Giacobbe, B.
Gabrielli, A.
Giorgi, F.
Pellegrini, G.
Sbarra, C.
Semprini, N.
Spighi, R.
Valentinetti, S.
Villa, M.
Zoccoli, A.
Citterio, M.
Liberali, V.
Palombo, F.
Andreoli, C.
Gaioni, L.
Pozzati, E.
Ratti, L.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2011, 628 (01): : 234 - 237
[4] Characterization of Bulk Damage in CMOS MAPS With Deep N-Well Collecting Electrode
Zucca, Stefano
Ratti, Lodovico
Traversi, Gianluca
Bettarini, Stefano
Morsani, Fabio
Rizzo, Giuliana
Bosisio, Luciano
Rashevskaya, Irina
Cindro, Vladimir
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2012, 59 (04) : 900 - 908
[5] A 3D deep n-well CMOS MAPS for the ILC vertex detector
Gaioni, L.
Manghisoni, M.
Ratti, L.
Re, V.
Traversi, G.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2010, 617 (1-3): : 324 - 326
[6] Recent progress in the development of 3D deep n-well CMOS MAPS
Traversi, G.
Gaioni, L.
Manazza, A.
Manghisoni, M.
Ratti, L.
Re, V.
Zucca, S.
JOURNAL OF INSTRUMENTATION, 2012, 7
[7] A 65-nm CMOS P-well/Deep N-well Avalanche Photodetector for Integrated 850-nm Optical
Pan, Quan
Hon, Zhengxiong
Wang, Yipeng
Yue, C. Patrick
2013 IEEE 10TH INTERNATIONAL CONFERENCE ON ASIC (ASICON), 2013,
[8] PERFORMANCE OF A SCALED SI GATE N-WELL CMOS TECHNOLOGY
ZIMMER, G
FIEDLER, H
HOEFFLINGER, B
NEUBERT, E
VOGT, H
ELECTRONICS LETTERS, 1981, 17 (18) : 666 - 667
[9] First generation of deep n-well CMOS MAPS with in-pixel sparsification for the ILC vertex detector
Traversi, Gianluca
Bulgheroni, Antonio
Caccia, Massimo
Jastrzab, Marcin
Manghisoni, Massimo
Pozzati, Enrico
Ratti, Lodovico
Re, Valerio
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2009, 604 (1-2): : 390 - 392
[10] Development of deep N-well monolithic active pixel sensors in a 0.13 μm CMOS technology
Bettarini, S.
Bardi, A.
Batignani, G.
Bosi, F.
Calderini, G.
Cenci, R.
Dell'Orso, M.
Forti, F.
Giannetti, P.
Giorgi, M. A.
Lusiani, A.
Marchiori, G.
Morsani, F.
Neri, N.
Paoloni, E.
Rizzo, G.
Walsh, J.
Andreoli, C.
Pozzati, E.
Ratti, L.
Speziali, V.
Manghisoni, M.
Re, V.
Traversi, G.
Bosisio, L.
Giacomini, G.
Lanceri, L.
Rachevskaia, I.
Vitale, L.
Bruschi, M.
Giacobbe, B.
Semprini, N.
Spighi, R.
Villa, M.
Zoccoli, A.
Gamba, D.
Giraudo, G.
Mereu, P.
Dalla Betta, G. F.
Soncini, G.
Fontana, G.
Pancheri, L.
Verzellesi, G.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2007, 572 (01): : 277 - 280

← 1 2 3 4 5 →