RGB-D Saliency Detection Based on Optimized ELM and Depth Level

被引:0
|
作者
Liu Zhengyi [1 ]
Xu Tianze [1 ]
机构
[1] Anhui Univ, Coll Comp Sci & Technol, Hefei 230601, Anhui, Peoples R China
关键词
RGB-D saliency detection; Extreme Learning Machine(ELM); Process optimization; Multiple features; Depth level optimization; EXTREME LEARNING-MACHINE;
D O I
10.11999/JEIT180826
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Currently, many saliency-detection methods focus on 2D-image. But, these methods cannot be applied in RGB-D image. Based on this situation, new methods which are suitable for RGB-D image are needed. This paper presents a novel algorithm based on Extreme Learning Machine(ELM), feature-extraction and depth-detection. Firstly, feature-extraction is used for getting a feature, which contains 4-scale superpixels and 4096 dimensions. Secondly, according to the 4-sacle superpixels, the RGB, LAB and LBP feature of RGB image are computed, and LBE feature of depth image. Thirdly, weak salient map with LBE and dark-channel features are computed, and the foreground objects is strengthened in every circle. Fourthly, according to weak salient map, both foreground seeds and background seeds are chosen, and then, put these seeds into ELM to compute the first stage salient map. Finally, depth-detection and graph-cut are used for optimizing the first stage salient map and getting the second stage salient map.
引用
收藏
页码:2224 / 2230
页数:7
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