X-ray absorption spectroscopy studies of electrochemically deposited thin oxide films

被引:0
|
作者
Balasubramanian, M [1 ]
Melendres, CA [1 ]
Mansour, AN [1 ]
Mini, S [1 ]
机构
[1] Argonne Natl Lab, Argonne, IL 60439 USA
关键词
D O I
10.1557/PROC-524-339
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have utilized "in situ" X-ray Absorption Fine Structure Spectroscopy to investigate the structure and composition of thin oxide films of nickel and iron that have been prepared by electrodeposition on a graphite substrate from aqueous solutions. The films are generally disordered. Structural information has been obtained from the analysis of the data. We also present initial findings on the local structure of heavy metal ions, e.g. Sr and Ce, incorporated into the electrodeposited nickel oxide films. Our results are of importance in a number of technological applications, among them, batteries, fuel cells, electrochromic and ferroelectric materials, corrosion protection, as well as environmental speciation and remediation.
引用
收藏
页码:339 / 345
页数:7
相关论文
共 50 条
  • [1] An X-ray absorption study of the local structure of cerium in electrochemically deposited thin films
    Balasubramanian, M
    Melendres, CA
    Mansour, AN
    [J]. THIN SOLID FILMS, 1999, 347 (1-2) : 178 - 183
  • [2] X-Ray spectroscopy of electrochemically deposited iridium oxide films: detection of multiple sites through structural disorder
    Hillman, A. Robert
    Skopek, Magdalena A.
    Gurman, Stephen J.
    [J]. PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2011, 13 (12) : 5252 - 5263
  • [3] X-ray absorption spectroscopy study of FePt thin films
    Martins, A.
    Souza-Neto, N. M.
    Fantini, M. C. A.
    Santos, A. D.
    Prado, R. J.
    Ramos, A. Y.
    [J]. JOURNAL OF APPLIED PHYSICS, 2006, 100 (01)
  • [4] X-ray absorption spectroscopy study of FePt thin films
    Martins, A.
    Souza-Neto, N.M.
    Fantini, M.C.A.
    Santos, A.D.
    Prado, R.J.
    Ramos, A.Y.
    [J]. Journal of Applied Physics, 2006, 100 (01):
  • [5] X-ray absorption spectroscopy in the analysis of GaN thin films
    Metson, JB
    Trodahl, HJ
    Ruck, BJ
    Lanke, UD
    Bittar, A
    [J]. SURFACE AND INTERFACE ANALYSIS, 2003, 35 (09) : 719 - 722
  • [6] X-ray absorption spectroscopy studies of nickel oxide thin film electrodes for supercapacitors
    Nam, KW
    Yoon, WS
    Kim, KB
    [J]. ELECTROCHIMICA ACTA, 2002, 47 (19) : 3201 - 3209
  • [7] X-ray absorption near edge structure and X-ray photoelectron spectroscopy studies of chloride in passive oxide films
    Natishan, PM
    Yu, SY
    O'Grady, WE
    Ramaker, DE
    [J]. ELECTROCHIMICA ACTA, 2002, 47 (19) : 3131 - 3136
  • [8] Structure of reactively sputter deposited tin-nitride thin films:: A combined X-ray photoelectron spectroscopy, in situ X-ray reflectivity and X-ray absorption spectroscopy study
    Lützenkirchen-Hecht, D
    Frahm, R
    [J]. THIN SOLID FILMS, 2005, 493 (1-2) : 67 - 76
  • [9] STRUCTURE AND X-RAY DENSITY OF ELECTROCHEMICALLY DEPOSITED RHENIUM FILMS
    PETROVICH, VA
    FEDENKOV, AL
    SHEPUREV, SY
    [J]. PROTECTION OF METALS, 1987, 23 (04): : 509 - 510