共 50 条
- [3] ULTRASONIC ATOMIC FORCE MICROSCOPY OF SUBSURFACE DEFECTS [J]. ACOUSTICAL IMAGING, VOL 29, 2008, 29 : 205 - 213
- [4] Enhanced sensitivity of nanoscale subsurface imaging by photothermal excitation in atomic force microscopy [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2020, 91 (06):
- [5] Contrast Mechanism of Ultrasonic-based Atomic Force Microscopy for Subsurface Imaging [J]. 2019 IEEE INTERNATIONAL ULTRASONICS SYMPOSIUM (IUS), 2019, : 936 - 939