Switching dynamics in non-volatile polymer memories

被引:11
|
作者
Verbakel, Frank [1 ,2 ]
Meskers, Stefan C. J. [1 ,2 ]
Janssen, Rene A. J. [1 ,2 ]
Gomes, Henrique L. [3 ]
van den Biggelaar, Antonius J. M. [4 ]
de Leeuw, Dago M. [4 ]
机构
[1] Eindhoven Univ Technol, NL-5600 MB Eindhoven, Netherlands
[2] Netherlands & Dutch Polymer Inst DPI, NL-5600 AX Eindhoven, Netherlands
[3] Univ Algarve, CEOT, P-8000 Faro, Portugal
[4] Philips Res Labs, NL-5656 AE Eindhoven, Netherlands
关键词
organic memory; resistive switching; polymer diode;
D O I
10.1016/j.orgel.2008.05.022
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The time dependence of resistive switching in metal-metal oxide-organic semiconductormetal diodes is investigated. The switching dynamics is controlled by two intrinsic time dependences. A single switching event occurs in a time scale of 400 nanoseconds. but the maximum repetitive switching between ON- and OFF-states is limited by a "dead time" of a few milliseconds. The dead time is the waiting time after programming in which a next switch is inhibited. Therefore, fast repetitive pulsing prevents the observation of non-volatile switching and limits the maximum clock rate at which these memories can be used. Understanding the origin of this dead time is crucial to future memory applications. Furthermore. the occurrence of a dead time is possibly the origin of the huge variation in the reported switching times. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:829 / 833
页数:5
相关论文
共 50 条
  • [1] Switching and filamentary conduction in non-volatile organic memories
    Colle, Michael
    Buchel, Michael
    de Leeuw, Dago M.
    [J]. ORGANIC ELECTRONICS, 2006, 7 (05) : 305 - 312
  • [2] Resistive switching and noise in non-volatile organic memories
    Vandamme, Lode K. J.
    Colle, Michael
    de Leeuw, Dago M.
    Verbakel, Frank
    [J]. NOISE AND FLUCTUATIONS IN CIRCUITS, DEVICES, AND MATERIALS, 2007, 6600
  • [3] ERASABLE NON-VOLATILE MEMORIES
    JAVETSKI, J
    [J]. ELECTRONIC PRODUCTS MAGAZINE, 1982, 24 (13): : 37 - 40
  • [4] Electrodeposition of copper tetracyanoquinodimethane for bipolar resistive switching non-volatile memories
    Muller, Robert
    Rouault, Olivier
    Katzenmeyer, Aaron
    Goux, Ludovic
    Wouters, Dirk J.
    Genoe, Jan
    Heremans, Paul
    [J]. PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2009, 367 (1905): : 4191 - 4201
  • [5] Non-volatile and Volatile Bipolar Resistive Electrical Switching in Ag and Cu Chalcogenide Memories with a Dedicated Switching Layer
    Radhakrishnan, Hariharsudan Sivaramakrishnan
    [J]. MELECON 2010: THE 15TH IEEE MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, 2010, : 515 - 520
  • [6] Non-Volatile Memories for Removable Media
    Micheloni, Rino
    Picca, Massimiliano
    Amato, Stefano
    Schwalm, Helmut
    Scheppler, Michael
    Commodar, Stefano
    [J]. PROCEEDINGS OF THE IEEE, 2009, 97 (01) : 148 - 160
  • [7] A BIST scheme for non-volatile memories
    Olivo, P
    Dalpasso, M
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1998, 12 (1-2): : 139 - 144
  • [8] Carbon nanomaterials for non-volatile memories
    Ethan C. Ahn
    H.-S. Philip Wong
    Eric Pop
    [J]. Nature Reviews Materials, 3
  • [9] A Bist Scheme for Non-Volatile Memories
    Piero Olivo
    Marcello Dalpasso
    [J]. Journal of Electronic Testing, 1998, 12 : 139 - 144
  • [10] Carbon nanomaterials for non-volatile memories
    Ahn, Ethan C.
    Wong, H. -S. Philip
    Pop, Eric
    [J]. NATURE REVIEWS MATERIALS, 2018, 3 (03):