Atomic- and Molecular-Resolution Mapping of Solid-Liquid Interfaces by 3D Atomic Force Microscopy

被引:133
|
作者
Fukuma, Takeshi [1 ]
Garcia, Ricardo [2 ]
机构
[1] Kanazawa Univ, Nano Life Sci Inst WPI NanoLSI, Kanazawa, Ishikawa 9201192, Japan
[2] ICMM, Mat Sci Factory, Madrid 28049, Spain
基金
欧洲研究理事会;
关键词
AFM; 3D-AFM; solid-liquid interfaces; hydration layers; atomic resolution; force maps; force-distance curves; force spectroscopy; MD simulations; HYDRATION LAYER STRUCTURE; DIRECT VISUALIZATION; SOFT MATTER; WATER; MODULATION; SURFACE; DYNAMICS; ANGSTROM; ENERGY; IDENTIFICATION;
D O I
10.1021/acsnano.8b07216
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Hydration layers are ubiquitous in life and technology. Hence, interfacial aqueous layers have a central role in a wide range of phenomena from materials science to molecular and cell biology. A complete understanding of those processes requires, among other things, the development of very-sensitive and high-resolution instruments. Three-dimensional atomic force microscopy (3D-AFM) represents the latest and most successful attempt to generate atomically resolved three-dimensional images of solid liquid interfaces. This review provides an overview of the 3D-AFM operating principles and its underlying physics. We illustrate and explain the capability of the instrument to resolve atomic defects on crystalline surfaces immersed in liquid. We also illustrate some of its applications to imaging the hydration structures on DNA or proteins. In the last section, we discuss some perspectives on emerging applications in materials science and molecular biology.
引用
收藏
页码:11785 / 11797
页数:13
相关论文
共 50 条
  • [1] Atomic force microscopy at solid-liquid interfaces
    O'Shea, SJ
    Welland, ME
    [J]. LANGMUIR, 1998, 14 (15) : 4186 - 4197
  • [2] ATOMIC-FORCE MICROSCOPY OF SOLID-LIQUID INTERFACES
    SOUZA, G
    GEORGIADIS, RM
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1994, 208 : 114 - CHED
  • [3] Resolving amorphous solid-liquid interfaces by atomic force microscopy
    Burson, Kristen M.
    Gura, Leonard
    Kell, Burkhard
    Buechner, Christin
    Lewandowski, Adrian L.
    Heyde, Markus
    Freund, Hans-Joachim
    [J]. APPLIED PHYSICS LETTERS, 2016, 108 (20)
  • [4] Damping near solid-liquid interfaces measured with atomic force microscopy
    Cambridge Univ, Cambridge, United Kingdom
    [J]. Langmuir, 4 (922-925):
  • [5] Damping near solid-liquid interfaces measured with atomic force microscopy
    O'Shea, SJ
    Lantz, MA
    Tokumoto, H
    [J]. LANGMUIR, 1999, 15 (04) : 922 - 925
  • [6] ATOMIC-FORCE MICROSCOPY OF LOCAL COMPLIANCE AT SOLID-LIQUID INTERFACES
    OSHEA, SJ
    WELLAND, ME
    PETHICA, JB
    [J]. CHEMICAL PHYSICS LETTERS, 1994, 223 (04) : 336 - 340
  • [7] MOLECULAR-RESOLUTION IMAGES OF ASPIRIN CRYSTALS WITH ATOMIC FORCE MICROSCOPY
    MASAKI, N
    MACHIDA, K
    KADO, H
    YOKOYAMA, K
    TOHDA, T
    [J]. ULTRAMICROSCOPY, 1992, 42 : 1148 - 1154
  • [8] Anharmonicity, solvation forces, and resolution in atomic force microscopy at the solid-liquid interface
    Voitchovsky, Kislon
    [J]. PHYSICAL REVIEW E, 2013, 88 (02):
  • [9] Molecular-Resolution Imaging of Ionic Liquid/Alkali Halide Interfaces with Varied Surface Charge Densities via Atomic Force Microscopy
    Bao, Yifan
    Nishiwaki, Yuto
    Kawano, Touma
    Utsunomiya, Toru
    Sugimura, Hiroyuki
    Ichii, Takashi
    [J]. ACS NANO, 2024, 18 (36) : 25302 - 25315
  • [10] ATOMIC FORCE MICROSCOPY OF ELECTROCHEMICAL PROCESSES AT THE SOLID-LIQUID INTERFACE
    GEWIRTH, AA
    CHEN, CH
    KEPLER, KD
    CHANG, CS
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1992, 203 : 142 - COLL