Chemical atomic-emission analysis of high-purity dimethyl- and diethyltellurium

被引：0
|
作者：
Zorin, AD [1 ]
Zanozina, VF [1 ]
Gayazova, IN [1 ]
Markova, ML [1 ]
Emel'yanova, OA [1 ]
机构：
[1] NI Lobachevskii State Univ, Chem Res Inst, Nizhnii Novgorod, Russia
来源：
INDUSTRIAL LABORATORY | 1998年 / 64卷 / 06期
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D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A new technique of sample preparation for volatile alkylated tellurium compounds is proposed that is based on their oxidative combustion to tellurium oxide in oxygen. A method for chemical atomic-emission determination of Fe, Ag, Co, Cu, In, Mg, Mn, Ni, V, and Zn in high-purity dimethyltellurium is described. The detection limit lies within 3 x 10(-5) - 5 x 10(-8) wt.% depending on the element. The relative standard deviation does not exceed 0.25.
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页码：382 / 384
页数：3
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