Electrical and magnetoresistivity studies in chemical solution deposited La(1-x)CaxMnO3 thin films

被引:14
|
作者
Angappane, S [1 ]
Murugaraj, P
Sethupathi, K
Rangarajan, G
Sastry, VS
Chakkaravarthi, AA
Ramasamy, P
机构
[1] Indian Inst Technol, Dept Phys, Madras 600036, Chennai, India
[2] Indira Gandhi Ctr Atom Res, Div Mat Sci, Kalpakkam 601302, Tamil Nadu, India
[3] Anna Univ, Ctr Crystal Growth, Chennai 600025, India
关键词
D O I
10.1063/1.1362659
中图分类号
O59 [应用物理学];
学科分类号
摘要
High quality magnetoresistive La(1-x)CaxMnO3 thin films have been prepared by the chemical solution deposition technique. A solution of propionate precursors of lanthanum, calcium, and manganese in propionic acid was used for this purpose. Films of varying compositions (x varying from 0.1 to 0.4) were spin coated on to LaAlO3(100) and SrTiO3(100) substrates at room temperature and pyrolyzed in the temperature range 600-850 degreesC. For fixed compositions, annealing at higher temperatures shifts the insulator-metal transition temperature (TI-M) to higher values accompanied by a reduction in the resistivity values. The TI-M variation for different x values was found to be less pronounced in the compositions x = 0.2, 0.3, and 0.4. Typical TI-M values of 283 K and 290 K were obtained for La0.7Ca0.3MnO3 coated on LaAlO3 and SrTiO3 substrates, respectively, when annealed at 850 degreesC. The substrate effect was found to be more pronounced for the x value 0.1 which showed two peaks (one at 271 K and another at 122 K) in the rho -T curve. The roles of substrate mismatch, composition variation, and annealing temperatures are discussed. (C) 2001 American Institute of Physics.
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页码:6979 / 6981
页数:3
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