The effect of frequency of electromagnetic vibration on the primary silicon size in hypereutectic Al-Si alloy

被引：0

作者：

Yoon, EP

Choi, JP

Park, JP

Kim, KB

Yoon, WY

Kim, MH

Kim, KH

Nam, TW

机构：

[1] Hanyang Univ, Div Engn & Mat Sci, Seoul 133791, South Korea

[2] Res Inst Ind Sci & Technol, Pohang 790600, South Korea

[3] Korea Inst Sci & Technol, Div Mat, Seoul 136791, South Korea

[4] Korea Univ, Div Engn & Mat Sci, Seoul 136701, South Korea

[5] Inha Univ, Sch Mat Sci & Engn, Inchon 402751, South Korea

[6] Korea Univ, Dept Mech Engn, Seoul 136701, South Korea

[7] Hanyang Univ, Dept Met & Mat Sci, Ansan 426791, South Korea

来源：

PRICM 5: THE FIFTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, PTS 1-5 | 2005年 / 475-479卷

关键词：

aluminum alloy; primary silicon; electromagnetic force; Al-Si; vibration;

D O I：

10.4028/www.scientific.net/MSF.475-479.413

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this study, the electromagnetic vibration is adopted for control of the size of primary Si phase. The higher the current density and frequency of electromagnetic vibration (EMV), the finer the size of primary Si phase. The higher the current density but the lower frequency of EMV, the bigger the size of primary Si phase. This phenomenon considered to be related the collision, agglomeration and diffusion of silicon atoms.

引用

页码：413 / 416

页数：4

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