Flatness-based open-loop and closed-loop control for electrostatic quasi-static microscanners using jerk-limited trajectory design

被引:31
|
作者
Schroedter, Richard [1 ]
Roth, Matthias [2 ]
Janschek, Klaus [2 ]
Sandner, Thilo [1 ]
机构
[1] Fraunhofer Inst Photon Microsyst, Act Microscanner Syst, Maria Reiche Str 2, D-01109 Dresden, Germany
[2] Tech Univ Dresden, Inst Automat, Fac Elect & Comp Engn, D-01062 Dresden, Germany
关键词
MEMS; Quasi-static/resonant microscanner; Electrostatic staggered vertical comb; Jerk-limited triangle trajectory; Flatness-based open-loop and closed-loop control; Global extended Luenberger observer; MICRO-SCANNING MIRROR; COMB-DRIVE ACTUATOR; MEMS SCANNER; LINEARIZATION; MICROMIRROR; PROJECTION;
D O I
10.1016/j.mechatronics.2017.03.005
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper describes the open-loop and closed-loop control for quasi-static microscanners exploiting the inherent flatness property. The developed nonlinear control method is verified on a gimbaled quasi-static/resonant scanning micro mirror with electrostatic staggered vertical comb (SVC) drive actuation. Based on a mechatronic micro mirror model, we present a flatness-based feed forward control method using jerk-limited trajectories to reduce undesired oscillations. For the closed-loop control we introduce a stabilizing linearizing feedback including an extended Luenberger observer for improvement of the command tracking in presence of model inaccuracies. The experimental results for both scenarios, open-loop and closed-loop control, are compared with simulations and further assessed in terms of performance and feasibility for industrial application. (C) 2017 Elsevier Ltd. All rights reserved.
引用
收藏
页码:318 / 331
页数:14
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