Effect of incorporating copper on resistive switching properties of ZnO films

被引:32
|
作者
Jia, C. H.
Dong, Q. C.
Zhang, W. F. [1 ]
机构
[1] Henan Univ, Lab Photovolta Mat Henan Prov, Kaifeng 475004, Peoples R China
基金
中国国家自然科学基金;
关键词
ZnO:Cu; Resistive switching; CU-DOPED ZNO; THIN-FILMS; IMPEDANCE SPECTROSCOPY; OPTICAL-PROPERTIES; DEPOSITION;
D O I
10.1016/j.jallcom.2012.01.035
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Undoped and copper-doped ZnO (ZnO:Cu) thin films of wurtzite structure with c-axis orientation were grown on F-doped SnO2 (FTO) substrates by pulsed laser deposition. Typical bipolar and reversible resistance switching effects were observed in these films, and the ratio of high and low resistance state (ON/OFF ratio) increases abruptly by introducing Cu. Based on the impedance spectra of ZnO and ZnO:Cu films, the change of resistance at high and low resistance states is found to be accompanied with the variance of depletion width. Furthermore, the depletion width of ZnO films changes little, while that of ZnO: Cu films varies greatly under different resistance states, which is consistent with the result of that ZnO: Cu films show a much larger ON/OFF ratio than ZnO films. Therefore, the resistance switchings are supposed to be due to the change of depletion width of Schottky barrier. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:250 / 254
页数:5
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