Ultrahigh vacuum scanning electron/tunneling combined microscope system

被引：0
|
作者：
Homma, Y [1 ]
Finnie, P [1 ]
Ogino, T [1 ]
机构：
[1] NTT, Basic Res Labs, Kanagawa 2430198, Japan
来源：
MICROBEAM ANALYSIS 2000, PROCEEDINGS | 2000年 / 165期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：375 / 376
页数：2
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