Research on system-level automatic metrology system for aircraft integrated automatic test equipment

被引:0
|
作者
Lee Qiongwei [1 ]
Fei Xiaojun [1 ]
机构
[1] Aeroinstrument Test & Calibrat Ctr, Beijing, Peoples R China
关键词
system-level metrology; automatic metrology; verification; calibration; IATE; parameters; uncertainty;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In order to solve the problems in metrology support for aircraft integrated automatic test equipment (IATE), the paper proposes a set of system-level automatic metrology project. First, the paper analyzes aircraft integrated automatic test equipment test demands and hardware/software construction, works out system level metrology rules, clarifies system-level metrology parameters, range and uncertainty. Second, it puts forward a set of methods for IATE system-level metrology, composing verification standards and calibration regulations. Third, through the development on dedicated metrology modules and test program set (TPS), it designs a system-level automatics metrology system for a certain aircraft IATE. The application shows the system-level automatic metrology system can realize metrology support for the aircraft IATE effectively, ensure the accuracy, consistency and credibility of the IATE parameters, shorten metrology support duration, lower technical level of metrology support personnel.
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页码:90 / 93
页数:4
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