The Domain Structure of Thin Ferroelectric Films

被引：0
|
作者：
Sokolov, A. A. [1 ]
Ivanov, S. D. [1 ]
机构：
[1] Russian Acad Sci, Inst Automat & Electrometry, Siberian Branch, Novosibirsk 630090, Russia
来源：
OPTOELECTRONICS INSTRUMENTATION AND DATA PROCESSING | 2022年 / 58卷 / 02期
关键词：
ferroelectrics; thin films; domain structure; pyroelectric coefficient; INTENSITY-MODULATION METHOD; NIOBATE;
D O I：
10.3103/S875669902202008X
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Methods for determining the domain structure of thin ferroelectric films from the time dependence of the pyroelectric response to a short pulsed surface heating have been considered. The distribution of the pyroelectric coefficient by thickness has been found from the time dependence of the pyroelectric current by solving a Fredholm equation of the first kind. In the general case, this problem is ill-posed; however, it can be solved under additional assumptions about the form of the resolvent. The distribution of the pyroelectric coefficient by depth in a thin film of barium strontium niobate has been established under the assumption of a wedge-shaped domain.
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收藏
页码：154 / 159
页数：6
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