Review of Uncertainty Quantification of Measurement and Computational Modeling in EMC Part I: Measurement Uncertainty

被引：16

作者：

Carobbi, Carlo F. M. ^{[1
]}

Lallechere, Sebastien ^{[2
]}

Arnaut, Luk R. ^{[3
]}

机构：

[1] Univ Firenze, Dept Informat Engn, I-50139 Florence, Italy

[2] Univ Clermont Auvergne, CNRS, SIGMA, Clermont Inst Pascal, F-63178 Aubiere, France

[3] Queen Mary Univ London, Sch Elect Engn & Comp Sci, London E1 4FZ, England

来源：

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 2019年 / 61卷 / 06期

关键词：

Assessment of conformity; Bayesian analysis; calibration; central limit theorem (CLT); complex-valued quantities; electromagnetic compatibility (EMC); literature review; measurement uncertainty (MU); Monte Carlo (MC) random sampling; propagation of distributions; propagation of uncertainty; robust statistics; standardization; testing; uncertainty quantification (UQ); IMPEDANCE;

D O I：

10.1109/TEMC.2019.2904973

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this two-parts paper, methods for the quantification of uncertainty in measurement and computational modeling are reviewed, with an emphasis on applications in electromagnetic compatibility (EMC). The current status of international standards relating to measurement uncertainty in EMC is provided (in part I), as well as a review of selected alternative methods and recent developments in the domain of computational modeling and empirical uncertainty quantification (in part II).

引用

页码：1690 / 1698

页数：9

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