Image contrast reversals in contact resonance atomic force microscopy

被引：11
|
作者：
Ma, Chengfu [1 ]
Chen, Yuhang [1 ]
Wang, Tian [1 ]
机构：
[1] Univ Sci & Technol China, Dept Precis Machinery & Precis Instrumentat, Hefei 230026, Anhui, Peoples R China
来源：
AIP ADVANCES | 2015年 / 5卷 / 02期
基金：
中国国家自然科学基金;
关键词：
ACOUSTIC MICROSCOPY; ULTRASONIC FREQUENCIES; ELASTIC PROPERTIES; AFM;
D O I：
10.1063/1.4908037
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Multiple image contrast inversions are observed along with the increase of modulation frequency for contact resonance atomic force microscopy (CR-AFM) imaging of a highly oriented pyrolytic graphite (HOPG) specimen. Analysis of the contact vibrational spectra indicates that the inversions can be attributed to structure-induced variations of tip-sample contact mechanics. Contact stiffness and damping at HOPG step edges exhibit significant increases relative to those in the flat regions. For quantitative evaluation of mechanical properties in CR-AFM, coupling effects of the surface geometry must be considered. (C) 2015 Author(s).
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收藏
页数：6
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