A 46-nF/10-Mω Range 114-aF/0.37-ω Resolution Parasitic- and Temperature-Insensitive Reconfigurable RC-to-Digital Converter in 0.18-μm CMOS

被引：5

作者：

George, Arup K. ^{[1
]}

Shim, Wooyoon ^{[1
]}

Kung, Jaeha ^{[1
]}

Kim, Ji-Hoon ^{[2
]}

Je, Minkyu ^{[3
]}

Lee, Junghyup ^{[1
]}

机构：

[1] Daegu Gyeongbuk Inst Sci & Technol DGIST, Dept Informat & Commun Engn, Daegu 42988, South Korea

[2] Ewha Womans Univ, Dept Elect Engn, Seoul 03760, South Korea

[3] Korea Adv Inst Sci & Technol KAIST, Dept Elect Engn, Daejeon 34141, South Korea

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS | 2022年 / 69卷 / 03期

基金：

新加坡国家研究基金会;

关键词：

Sensors; Oscillators; Jitter; Inverters; Capacitance; Temperature sensors; Capacitive sensors; Sensor interface; reconfigurable; capacitance; resistance; digital conversion; parasitic; temperature; CMOS; DIFFERENTIAL RELAXATION-OSCILLATOR; READ-OUT CIRCUIT; LOW-POWER; SENSOR INTERFACE; CAPACITIVE SENSORS; HUMIDITY SENSOR; DUAL-SLOPE; PRESSURE; WIRELESS; NOISE;

D O I：

10.1109/TCSI.2021.3134010

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a 46 nF/10 M omega-range, digital-intensive, reconfigurable RC-to-digital converter ((RCDC)-C-2) that can readout multiple C and R sensors in a time-interleaved fashion. Ratio-metric conversion using swing-boosted period-modulation (SB-PM) front-end by the (RCDC)-C-2 results in 114 aFrms/0.37 omega rms resolutions and a worst-case temperature-drift of 64.2 ppm/degrees C over -40 to 125 degrees C. Femto-farad capacitances can be sensed with a relative code-deviation less than 0.16 % even when parasitics vary 30 times the baseline. Implemented in a 0.18 mu m standard CMOS process, the (RCDC)-C-2 consumes 140 mu A from a 1 V supply, occupying an active area of 0.175 mu m(2).

引用

页码：1171 / 1184

页数：14

共 2 条

[1] A 114-aFrms-Resolution 46-nF/10-MΩ -Range Digital-Intensive Reconfigurable RC-to-Digital Converter with Parasitic-Insensitive Femto-Farad Baseline Sensing
George, Amp K.
Shim, Wooyoon
Je, Minkyu
Lee, Junghyup
2018 IEEE SYMPOSIUM ON VLSI CIRCUITS, 2018, : 157 - 158
[2] A 0.8 V Supply- and Temperature-Insensitive Capacitance-to-Digital Converter in 0.18-μm CMOS
George, Arup K.
Lee, Junghyup
Kong, Zhi Hui
Je, Minkyu
IEEE SENSORS JOURNAL, 2016, 16 (13) : 5354 - 5364

← 1 →