The dielectric properties of the piezoelectric PZT thick films

被引：1
|
作者：
Tang, F [1 ]
Chinkhota, M [1 ]
Brown, WD [1 ]
Wang, JT [1 ]
机构：
[1] Southern Univ & A&M Coll, Dept Phys, Baton Rouge, LA 70813 USA
来源：
INTERNATIONAL JOURNAL OF MODERN PHYSICS B | 1998年 / 12卷 / 29-31期
关键词：
D O I：
10.1142/S0217979298002763
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The piezoelectric PZT thick films were fabricated by spinning and painting techniques in our laboratory. The purpose of this paper is to study the characteristics of the piezoelectric films that could be used as the sensors in devices, smart materials and structures. The effects of processing methods and processing conditions on dielectric properties of thick films are investigated. The temperature dependencies of the dielectric constants and the loss of the sample are measured before and after poling. Our experimental re suits might provide a better understanding of the behavior of these types of materials regarding their applications in monitoring, active controlling and diagnosing.
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页码：3412 / 3417
页数：6
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