Porous silica pellicle frame

被引:0
|
作者
Jeng, DY [1 ]
Meixner, DL [1 ]
Ganguli, R [1 ]
Colbern, S [1 ]
Robinson, T [1 ]
Morris, M [1 ]
Chaudhuri, SR [1 ]
Grenon, B [1 ]
机构
[1] YTC Amer Inc, Camarillo, CA 93012 USA
关键词
sol-gel; photomask frame; pellicle; fused silica; porous silica; 157-nm processing; impurity scavenging;
D O I
10.1117/12.518562
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Two main issues with current pellicle frames are: (1) thermal expansion mismatch between the anodized aluminum frame and the photomask, and (2) the lack of porosity for purging and contamination control. Both issues can be addressed by using a sol-gel-derived porous silica frame. The silica frame has essentially the same thermal expansion coefficient as the fused silica photomask substrate. The porous nature of the silica frame provides contamination control by N-2 purging and scavenging capability. The porosity characteristics and mechanical properties of the frame material were determined. Porous silica frame was successfully mounted onto quartz plate by a commercial process, suggesting the suitability of using porous silica as pellicle frame material. The sol-gel derived porous silica represents the first proof-of-concept for an alternative frame material with a potentially significant impact on the photomask industry.
引用
收藏
页码:213 / 221
页数:9
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