Phase Shift Consideration Mechanisms in Aging-Aware Standard Cell Libraries

Aging-aware standard cell libraries are characterized to estimate aging impact on digital integrated circuits (IC) and to measure parameters of digital IC after degradation. In existing libraries cells are characterized considering cell's input signals' slops, output loads and input signals' duty cycles. However, besides duty cycle, aging has different impacts on cells depending on the phase shift between input signals. Standard cells' input signals phase shift sweeping mechanisms are proposed in this paper during characterization of standard cell libraries, which have high accuracy and don't require huge machine resources and simulation run time.