Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever

被引：261

作者：

Rodríguez, TR ^{[1
]}

García, R ^{[1
]}

机构：

[1] CSIC, Inst Microelect Madrid, Madrid 28760, Spain

来源：

APPLIED PHYSICS LETTERS | 2004年 / 84卷 / 03期

关键词：

D O I：

10.1063/1.1642273

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We propose a method for mapping the composition of a surface by using an amplitude modulation atomic force microscope operated without tip-surface mechanical contact. The method consists in exciting the first two modes of the microcantilever. The nonlinear dynamics of the tip motion, the coupling of its first two modes, and the sensitivity of the second mode to long-range attractive forces allows us to use this mode to probe compositional changes while the signal from the first mode is used to image the sample surface. We demonstrate that the second mode has a sensitivity to surface force variations below 10(-11) N. (C) 2004 American Institute of Physics.

引用

页码：449 / 451

页数：3

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