Quantify nanoscale surface properties using advanced scanning probe microscopy

被引：0
|
作者：
Na, Chongzheng [1 ]
Yu, Qiang [1 ]
机构：
[1] Dept Civil Engn & Geol Sci, Notre Dame, IN 46556 USA
来源：
GEOCHIMICA ET COSMOCHIMICA ACTA | 2010年 / 74卷 / 12期
关键词：
D O I：
暂无
中图分类号：
P3 [地球物理学]; P59 [地球化学];
学科分类号：
0708 ; 070902 ;
摘要：
引用
收藏
页码：A743 / A743
页数：1
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