Collapse of thermal activation in moderately damped Josephson junctions -: art. no. 157002

被引：69
|
作者：
Krasnov, VM [1 ]
Bauch, T
Intiso, S
Hürfeld, E
Akazaki, T
Takayanagi, H
Delsing, P
机构：
[1] Stockholm Univ, Dept Phys, Albanova Univ Ctr, SE-10691 Stockholm, Sweden
[2] Chalmers Univ Technol, Dept Microtechnol & Nanosci, SE-41296 Gothenburg, Sweden
[3] NTT Corp, Basic Res Labs, Atsugi, Kanagawa 24301, Japan
来源：
PHYSICAL REVIEW LETTERS | 2005年 / 95卷 / 15期
关键词：
D O I：
10.1103/PhysRevLett.95.157002
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We study switching current statistics in moderately damped Nb-InAs-Nb and intrinsic Bi2Sr2CaCu2O8+delta Josephson junctions. A paradoxical collapse of thermal activation with increasing temperature is reported and explained by the interplay of two conflicting consequences of thermal fluctuations, which can both assist in premature escape and help in retrapping back into the stationary state. We analyze the influence of dissipation on the thermal escape by tuning damping with a gate voltage, magnetic field, temperature, and an in situ capacitor.
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页数：4
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