Phase-shifting projected fringe profilometry using ternary-encoded patterns

被引：2
|
作者：
Chen, Sih-Yue [1 ]
Cheng, Nai-Jen [2 ]
Su, Wei-Hung [1 ]
机构：
[1] Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 804, Taiwan
[2] Natl Kaohsiung Univ Appl Sci, Inst Photon & Commun, Kaohsiung 807, Taiwan
来源：
PHOTONIC FIBER AND CRYSTAL DEVICES: ADVANCES IN MATERIALS AND INNOVATIONS IN DEVICE APPLICATIONS XI | 2017年 / 10382卷
关键词：
phase unwrapping; fringe analysis; fringe projection; projected fringe profilometry; optical inspection; UNWRAPPING ALGORITHM; PROFILE MEASUREMENT; LIGHT PROJECTION; CODING METHOD; GRAY-CODE; RETRIEVAL; CALIBRATION; GRATINGS; OBJECTS; DESIGN;
D O I：
10.1117/12.2275325
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A fringe projection profilometry is presented. It uses the phase-shifting technique perform the phase-extraction and use the ternary-encoded patterns to identify the fringe orders. Only five-shot measurements are required for data processing. Experiments show that absolute phases could be obtained with high reliability.
引用
收藏
页数：7
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