Growth and Characterization Studies of ZnS Thin Films Prepared by Single Source Evaporation Technique

被引：2
|
作者：
Maligi, Anantha Sunil [1 ]
Jampana, Nagaraju [1 ]
Gowravaram, Mohan Rao [1 ]
机构：
[1] Indian Inst Sci, Dept Instrumentat & Appl Phys, Bangalore 12, Karnataka, India
来源：
61ST DAE-SOLID STATE PHYSICS SYMPOSIUM | 2017年 / 1832卷
关键词：
ZnS; Thermal evaporation; Cubic structure; Window layer; OPTICAL-PROPERTIES; SPRAY-PYROLYSIS; PH;
D O I：
10.1063/1.4980540
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Zinc sulfide thin films are deposited on glass substrates using thermal evaporation technique. Effect of thickness on the properties of as-deposited ZnS films is studied. ZnS films exhibited cubic structure with preferential orientation along (111) plane. All the films exhibited n-type conductivity with resistivity ranging in the order of 10(5) to 10(6) Omega-cm. The transmittance in the visible region is in the range of 80 to 89% and the band gap of the material varied from 3.65 to 3.52 eV. The as-deposited films can be used as window layer for fabrication of hetero-junction solar cell.
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页数：3
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