Turning waves and crustal reflection profiling

被引:2
|
作者
Stadtlander, R [1 ]
Brown, L [1 ]
机构
[1] CORNELL UNIV,INST STUDY CONTINENTS,ITHACA,NY 14853
关键词
D O I
10.1190/1.1444135
中图分类号
P3 [地球物理学]; P59 [地球化学];
学科分类号
0708 ; 070902 ;
摘要
In the past, steeply dipping features were often recognized on seismic reflection profiles only from indirect evidence such as vertical offsets of cross-cutting structures. New imaging algorithms, as for example, turning wave migration have had dramatic success in delineating steep, even-overturned reflectors in sedimentary environments. Evaluation of the applicability of this technology to deep seismic recordings indicates that steep-dip and turning wave migration will have limited practicality, generally, in the imaging of basement features because of the weak velocity gradients involved and the corollary requirement for large recording offsets. A potential exception arises when the basement structures to be imaged lie beneath a significant thickness of relatively young (i.e., steep velocity gradient) sedimentary cover.
引用
收藏
页码:335 / 341
页数:7
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