Fabrication of a nanogap on a metal nanowire using scanning probe lithography

被引:19
|
作者
Miyazaki, T [1 ]
Kobayashi, K [1 ]
Horiuchi, T [1 ]
Yamada, H [1 ]
Matsushige, K [1 ]
机构
[1] Kyoto Univ, Dept Elect Sci & Engn, Sakyo Ku, Kyoto 6068501, Japan
关键词
molecular electronics; scanning probe lithography; nanowire; nanogap electrodes;
D O I
10.1143/JJAP.40.4365
中图分类号
O59 [应用物理学];
学科分类号
摘要
A molecular electronics device (MED), which makes use of the functionality of one or several molecules, is a very attractive nanotechnology. However, it is necessary to both fabricate conductive metal nanowire circuits and insert the desired functional molecule at any position on the circuits in order to realize superintegrated circuits using molecular electronics. Therefore, a technique for fabricating nanogaps at any position on a metal nanowire is very important. We patterned an electron-beam negative resist SAL601 using the scanning probe lithography (SPL) technique and the resist patterns were transferred to the underlying titanium film by wet etching. We fabricated a continuous 20-mum-long Ti nanowire, thus this method can be combined with conventional photolithography, Using this combination, we fabricated a Ti nanowire connected to a large Pt pad electrode, and measured its current-voltage property with an atomic force microscopy (AFM) conductive tip. Moreover, we fabricated nanogaps on this line pattern by switching off the voltage bias between the AFM tip and the sample for a short time. Using these techniques, we fabricated nanogap electrodes with both nanometer-scale width and gap. It is expected that the electrodes can also be applied for electric measurement of one or several molecules.
引用
收藏
页码:4365 / 4367
页数:3
相关论文
共 50 条
  • [1] Scanning probe lithography for fabrication of Ti metal nanodot arrays
    Jung, B.
    Jo, W.
    Gwon, M. J.
    Lee, E.
    Kim, D. -W.
    [J]. ULTRAMICROSCOPY, 2010, 110 (06) : 737 - 740
  • [2] Fabrication of nanostructures using scanning probe microscope lithography
    Lee, SY
    Kim, JG
    Shin, WS
    Lee, HJ
    Koo, SY
    Lee, HW
    [J]. MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS, 2004, 24 (1-2): : 3 - 9
  • [3] Anisotropic Particle Fabrication Using Thermal Scanning Probe Lithography
    Das, Tanweepriya
    Smith, James D.
    Uddin, Md Hemayet
    Dagastine, Raymond R.
    [J]. ACS APPLIED MATERIALS & INTERFACES, 2022, 14 (17) : 19878 - 19888
  • [4] FABRICATION OF TUNNEL BARRIER BY SCANNING PROBE LITHOGRAPHY
    Pavlova, A. Yu.
    Khivintsev, Yu. V.
    Filimonov, Yu. A.
    Zaharov, A. A.
    Tiercelin, N.
    Pernod, P.
    [J]. 2012 INTERNATIONAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRON DEVICES ENGINEERING (APEDE 2012), 2012, : 377 - 380
  • [5] Scanning probe lithography for nanoimprinting mould fabrication
    Luo, Gang
    Xie, Guoyong
    Zhang, Yongyi
    Zhang, Guoming
    Zhang, Yingying
    Carlberg, Patrick
    Zhu, Tao
    Liu, Zhongfan
    [J]. NANOTECHNOLOGY, 2006, 17 (12) : 3018 - 3022
  • [6] Lithography-independent and large scale fabrication of a metal electrode nanogap
    Li Yan
    Wang Xiaofeng
    Zhang Jiayong
    Wang Xiaodong
    Fan Zhongchao
    Yang Fuhua
    [J]. JOURNAL OF SEMICONDUCTORS, 2009, 30 (09)
  • [7] Lithography-independent and large scale fabrication of a metal electrode nanogap
    李艳
    王晓峰
    张加勇
    王晓东
    樊中朝
    杨富华
    [J]. Journal of Semiconductors, 2009, 30 (09) : 142 - 145
  • [8] Fabrication of nanowire polarizer by using nanoimprint lithography
    Kim, JS
    Lee, KD
    Ahn, SW
    Kim, SH
    Park, JD
    Lee, SE
    Yoon, SS
    [J]. JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2004, 45 : S890 - S892
  • [9] Process Parameter Optimization of Scanning Probe Lithography for Anodic Oxidation of Nanowire
    Kuo, Chung-Feng Jeffrey
    Su, Te-Li
    Hung, Shih-Jung
    [J]. MATERIALS AND MANUFACTURING PROCESSES, 2015, 30 (05) : 669 - 676
  • [10] Fabrication of Nanogap Electrodes by the Molecular Lithography Technique
    Nishino, Takayuki
    Negishi, Ryota
    Tanaka, Hirofumi
    Ogawa, Takuji
    Ishibashi, Koji
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2011, 50 (03)