Survivable Mapping with Maximal Physical-Layer Failure-Localization Potential in IP over Transparent Optical Networks

被引:0
|
作者
Ni, Wenda [1 ]
Ye, Yabin
Schlosser, Michael
Patzak, Erwin
Zhang, Hanyi [1 ]
机构
[1] Tsinghua Univ, Dept Elect Engn, Tsinghua Natl Lab Informat Sci & Technol, Beijing 100084, Peoples R China
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Physical-layer failure-localization potential is explored in finding the survivable mapped lightpaths of IP over transparent optical networks. Numerical results show that accurate or near-accurate failure localizations are achieved with the new survivable mapping design. (C) 2009 Optical Society of America
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页数:3
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