Noise assessment for passive FT-IR spectrometer measurements

被引：4
|
作者：
Combs, RJ [1 ]
机构：
[1] USA, Edgewood Res Dev & Engn Ctr, Aberdeen Proving Ground, MD 21010 USA
来源：
ELECTRO-OPTICAL TECHNOLOGY FOR REMOTE CHEMICAL DETECTION AND IDENTIFICATION III | 1998年 / 3383卷
关键词：
infrared spectrometry; noise equivalent radiance; infrared analysis;
D O I：
10.1117/12.317638
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The spectroradiometric performance characteristics of a FT-IR spectrometer are evaluated as a function of temperature, optical mirror velocity, and spectral resolution. The noise equivalent radiance per root Hertz is used in these noise evaluations and is shown to be an important Michelson interferometer figure of merit.
引用
收藏
页码：75 / 91
页数：17
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