Temperature-dependent local electromagnetic characterization of electronic materials by scanning microwave near-field technique

被引：0
|
作者：
Feng, YJ [1 ]
Jiang, T [1 ]
Sun, J [1 ]
Wu, LY [1 ]
Wang, KL [1 ]
机构：
[1] Nanjing Univ, State Key Lab Modern Acoust, Dept Elect Sci & Engn, Nanjing 210093, Peoples R China
来源：
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2005年 / 122卷 / 01期
基金：
中国国家自然科学基金; 高等学校博士学科点专项科研基金;
关键词：
microwave near-field microscopy; magnetic materials; superconductivity materials;
D O I：
10.1016/j.mseb.2005.04.017
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We report a scanning microwave near-field microscope that allows temperature-dependent local electromagnetic characterization of electronic materials. We have established a temperature-controlled sample stage cooled by liquid nitrogen, so that the local electromagnetic properties of the sample could be studied through near-field microwave interaction at temperature varying from 80 to 300 K. Using this instrument, we have studied the magnetic phase transition of an Nd0.7Sr0.3MnO3-delta thin film and an ion-pair complex magnetic material, as well as the homogeneity of the microwave surface resistance of a YBa2Cu3O7-delta superconducting thin film. Experiment results have demonstrated the ability of temperature-dependent local microwave characterization of this microwave microscope for different kind of electronic materials. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码：49 / 54
页数：6
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