Significant enhancement of critical current density in MgB2 with HgO doping under high pressure

被引:2
|
作者
Cui, Yajing [1 ]
Chen, Yongliang [1 ]
Yang, Ye [1 ]
Hong, Shiming [2 ]
Cheng, Cuihua [3 ]
Zhao, Yong [1 ,3 ]
机构
[1] SW Jiaotong Univ, Superconduct R&D Ctr SRDC, Minist Educ China, Key Lab Adv Technol Mat, Chengdu 610031, Peoples R China
[2] SW Jiaotong Univ, Lab High Pressure Phys, Chengdu 610031, Peoples R China
[3] Univ New S Wale, Sch Mat Sci & Engn, Superconduct Res Grp, Sydney, NSW, Australia
基金
澳大利亚研究理事会; 中国国家自然科学基金;
关键词
critical currents; doping; MgB2; superconductivity; SUPERCONDUCTIVITY; TEMPERATURE; TRANSITION; FIELD; JC;
D O I
10.1002/pssa.200925621
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A series of HgO-doped MgB2 samples have been prepared under high pressure. Even 27 and 43 wt% impurities have been observed in the Mg1.05-x(HgO)(x)B-2 samples with x = 0.05 and 0.075, the critical current density, J(c), have been significantly improved under both low and high magnetic fields. XRD and scanning electron microscope (SEM) analyses revealed that HgO reacted with Mg to form MgHg alloy. The formation of MgHg alloy contributed not only to the refinement of MgB2 grain size and improvement of grain connection, but also to homogeneous distribution of a large amount of impurities in the MgB2 matrix. As a consequence, grain-boundary pinning was strengthened and new point pinning was generated. Effective improvement of flux pinning together with the very high impurity tolerance in HgO-doped MgB2 samples might provide another potential route to prepare high-performance MgB2 bulks and wires on an industrial scale. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:2532 / 2537
页数:6
相关论文
共 50 条
  • [1] Significant enhancement of critical current density by effective carbon-doping in MgB2 thin films
    Ranot, Mahipal
    Lee, O. Y.
    Kang, W. N.
    PROGRESS IN SUPERCONDUCTIVITY AND CRYOGENICS, 2013, 15 (02): : 12 - 15
  • [2] Enhancement of critical current density in MgB2 bulk superconductor by Ti doping
    Zhao, Y
    Feng, Y
    Machi, T
    Cheng, CH
    Huang, DX
    Fudamoto, Y
    Koshizuka, N
    Murakami, M
    EUROPHYSICS LETTERS, 2002, 57 (03): : 437 - 443
  • [3] Significant enhancement of critical current density and flux pinning in MgB2 with nano-SiC, Si, and C doping
    Wang, XL
    Soltanian, S
    James, M
    Qin, MJ
    Horvat, J
    Yao, QW
    Liu, HK
    Dou, SX
    PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2004, 408 : 63 - 67
  • [4] Enhancement of critical current density of MgB2 by doping Ho2O3
    Cheng, C.
    Zhao, Y.
    APPLIED PHYSICS LETTERS, 2006, 89 (25)
  • [5] Improvement of critical current density in MgB2 superconductors by Zr doping at ambient pressure
    Feng, Y
    Zhao, Y
    Sun, YP
    Liu, FC
    Fu, BQ
    Zhou, L
    Cheng, CH
    Koshizuka, N
    Murakami, M
    APPLIED PHYSICS LETTERS, 2001, 79 (24) : 3983 - 3985
  • [6] Enhancement of the critical current density and flux pinning of MgB2 superconductor by nanoparticle SIC doping
    Dou, SX
    Soltanian, S
    Horvat, J
    Wang, XL
    Zhou, SH
    Ionescu, M
    Liu, HK
    Munroe, P
    Tomsic, M
    APPLIED PHYSICS LETTERS, 2002, 81 (18) : 3419 - 3421
  • [7] Enhancement of critical fields and current of MgB2 by co-doping
    Novosel, N.
    Galic, S.
    Pajic, D.
    Skoko, Z.
    Loncarek, I.
    Mustapic, M.
    Zadro, K.
    Babic, E.
    SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2013, 26 (10):
  • [8] Doping effects of carbon and titanium on the critical current density of MgB2
    Shen, T. M.
    Li, G.
    Cheng, C. H.
    Zhao, Y.
    SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2006, 19 (11): : 1219 - 1224
  • [9] Effect of La doping on microstructure and critical current density of MgB2
    Shekhar, C
    Giri, R
    Tiwari, RS
    Rana, DS
    Malik, SK
    Srivastava, ON
    SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2005, 18 (09): : 1210 - 1214
  • [10] Enhancement of critical current density in MgB2 bulks burying sintered with commercial MgB2 powder
    Qi Cai
    Yongchang Liu
    Jie Xiong
    Zongqing Ma
    Journal of Materials Science: Materials in Electronics, 2018, 29 : 10323 - 10328