High-sensitivity photon-counting imaging detector

被引:0
|
作者
Fu, LC [1 ]
Li, Y [1 ]
Duanmu, QD [1 ]
Wang, GZ [1 ]
机构
[1] Changchun Univ Sci & Technol, Changchun 130022, Jilin, Peoples R China
关键词
minimal weak light detection; electron bombardment mode PSD; photon counting;
D O I
10.1117/12.573843
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Theoretical foundation and principle programmer will be studied in this paper that special photosensitive Si-PSD (Si-Position Sensitive Detector) is rebuilt into electron bombardment mode device, which is based on minimal weak light detecting technical demands and exciting principle of high-energy electronic beam acting on silicon semiconductor. At the same time we will bring forward new concept device of electron bombardment mode PSD. According to the theoretical foundation and principle programmer, we present the practical measurement result that semiconductor gain of electron bombardment mode device is obtained. When incident electron energy is more than 4KeV, then obtained more than 103 gain. We have produced high-sensitivity photon-counting imaging detector (MCP-PSD tube) with 108109 gain, which combined the research of microchannel plate (MCP) cascade applications with electron bombardment mode device. This paper also will present the substantial photograph of electron bombardment mode PSD device and MCP-PSD tube. Finally we will bring forward prospect realizing detection of minimal weak light photon-counting imaging.
引用
收藏
页码:439 / 442
页数:4
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