Broadband wide-angle antireflection enhancement in AZO/Si shell/core subwavelength grating structures with hydrophobic surface for Si-based solar cells

被引:44
|
作者
Leem, Jung Woo [1 ]
Song, Young Min [2 ]
Yu, Jae Su [1 ]
机构
[1] Kyung Hee Univ, Dept Elect & Radio Engn, Yongin 446701, Gyeonggi Do, South Korea
[2] Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USA
来源
OPTICS EXPRESS | 2011年 / 19卷 / 19期
基金
新加坡国家研究基金会;
关键词
TRANSPARENT CONDUCTING OXIDE; LOW-REFRACTIVE-INDEX; EFFICIENCY ENHANCEMENT; NANOWIRE ARRAYS; THIN-FILMS; SILICON; DEPOSITION; COATINGS; LAYERS; PHOTOVOLTAICS;
D O I
10.1364/OE.19.0A1155
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Broadband wide-angle antireflection characteristics of aluminum-doped zinc oxide (AZO)/silicon (Si) shell/core subwavelength grating (SWG) structures with a hydrophobic surface, together with theoretical prediction using a rigorous coupled-wave analysis simulation, were investigated for Si-based solar cells. The AZO films with different thicknesses were deposited on Si SWGs by rf magnetron sputtering method, which forms a shell/core structure. The AZO/Si shell/core SWGs reduced significantly the surface reflection compared to the AZO films/Si substrate. The coverage of AZO films on Si SWGs improved the antireflective property over a wider incident angle. The AZO/Si shell/core SWG structure with a 200 nm-thick AZO layer deposited at an rf power of 200 W exhibited a water contact angle of 123 degrees. This structure also exhibited a low average reflectance of similar to 2% over a wide wavelength range of 300-2100 nm with a solar weighted reflectance of 2.8%, maintaining a reflectance of < 9.2% at wavelengths of 300-2100 nm up to the incident angle of theta(i) = 70 degrees. The effective electrical properties of AZO films in AZO/Si shell/core SWGs were also analyzed. (C) 2011 Optical Society of America
引用
收藏
页码:A1155 / A1164
页数:10
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