High-performance x-ray detector for appearance potential spectroscopy

被引:10
|
作者
Rangelov, G
Ertl, K
Passek, F
Vonbank, M
Bassen, S
Reinmuth, J
Donath, M
Dose, V
机构
[1] Univ Bayreuth, D-95440 Bayreuth, Germany
[2] Max Planck Inst Plasmaphys, D-85740 Garching, Germany
关键词
D O I
10.1116/1.581416
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A high-performance detector for soft x-ray appearance potential spectroscopy is described. It basically consists of an alkali halide photon-to-electron converting layer evaporated onto a self-supporting amorphous carbon foil. This combination absorbs the low energy photons thereby increasing the signal-to-noise ratio. Further improvement of the signal-to-noise ratio is achieved by an additional x-ray filter. The choice of filter and converter material depends on the characteristic radiation of interest. The electrons emitted from the converter are detected by means of a microchannel plate. With this detector a signal-to-noise ratio of 150 was obtained at the diamond appearance potential spectroscopic peak for 5 mC charge per point. (C) 1998 American Vacuum Society. [S0734-2101(98)02404-X].
引用
收藏
页码:2738 / 2741
页数:4
相关论文
共 50 条
  • [1] Halide perovskites for high-performance X-ray detector
    Li, Zhizai
    Zhou, Faguang
    Yao, HuanHuan
    Ci, Zhipeng
    Yang, Zhou
    Jin, Zhiwen
    MATERIALS TODAY, 2021, 48 : 155 - 175
  • [2] SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPY WITH A CHANNELPLATE DETECTOR
    WITHERS, RS
    LEE, RN
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1979, 50 (03): : 326 - 329
  • [3] High temperature X-ray and γ-ray spectroscopy with a diamond detector
    Bodie, C. S.
    Lioliou, G.
    Whitaker, M. D. C.
    Barnett, A. M.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2024, 1058
  • [4] INVESTIGATION OF SURFACE OXIDE LAYERS BY X-RAY APPEARANCE POTENTIAL SPECTROSCOPY
    RAMACHANDRAN, KN
    COX, CD
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1974, 121 (05) : 673 - 675
  • [5] High-performance x-ray silicon detector for reliable industrial and research XRF applications
    Paepen, J
    Osorio, V
    Van Espen, P
    Evrard, O
    Van Buul, L
    Keters, M
    Jordanov, VT
    Burger, P
    X-RAY SPECTROMETRY, 2005, 34 (05) : 417 - 420
  • [6] Performance of a new schottky CdTe detector for hard X-ray spectroscopy
    Takahashi, T
    Hirose, EH
    Matsumoto, C
    Takizawa, K
    Ohno, R
    Ozaki, T
    Mori, K
    Tomita, Y
    HARD X-RAY AND GAMMA-RAY DETECTOR PHYSICS AND APPLICATIONS, 1998, 3446 : 29 - 37
  • [7] Performance of a new schottky CdTe detector for hard X-ray spectroscopy
    Matsumoto, C
    Takahashi, T
    Takizawa, K
    Ohno, R
    Ozaki, T
    Mori, K
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (03) : 428 - 432
  • [8] Performance of a new Schottky CdTe detector for hard x-ray spectroscopy
    Inst of Space and Astronautical, Science, Kanagawa, Japan
    IEEE Trans Nucl Sci, 3 pt 1 (428-432):
  • [9] Performance of a new Schottky CdTe detector for hard X-ray spectroscopy
    Matsumoto, C
    Takahashi, T
    Takizawa, K
    Ohno, R
    Ozaki, T
    Mori, K
    1997 IEEE NUCLEAR SCIENCE SYMPOSIUM - CONFERENCE RECORD, VOLS 1 & 2, 1998, : 569 - 573
  • [10] X-RAY PHOTOELECTRON-SPECTROSCOPY STUDIES OF PHOTOCHEMICAL CHANGES IN HIGH-PERFORMANCE FIBERS
    HAMILTON, LE
    SHERWOOD, PMA
    REAGAN, BM
    APPLIED SPECTROSCOPY, 1993, 47 (02) : 139 - 149