Space charge effects in carrier escape from single quantum well structures

被引:0
|
作者
McFarlane, SC [1 ]
Barnes, J [1 ]
Barnham, KWJ [1 ]
Tsui, ESM [1 ]
机构
[1] UNIV LONDON IMPERIAL COLL SCI TECHNOL & MED, BLACKETT LAB, LONDON, ENGLAND
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Steady-state photoluminescence and photocurrent efficiencies have been measured for single quantum well (SQW) p-i-n devices at forward bias over a range of temperature. These efficiencies depend on the competition between carrier escape from the well and both radiative and non-radiative recombination. From the efficiencies, two dimensionless parameters can be obtained; each depends only on the importance of escape relative to one of the two recombination processes. One of the parameters shows an unexpected thermal activation. An explanation is advanced in terms of band-bending caused by space charge in the well.
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页码:437 / 440
页数:4
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