The effect of AlN underlayer on c-axis orientation of barium ferrite thin films for perpendicular magnetic recording media

The effect of AIN underlayer on c-axis orientation of barium ferrite thin films and their magnetic properties have been investigated. On the AIN underlayer with a thickness of 30 nm, barium ferrite film with a thickness of 50 nm was deposited at room temperature. As the deposited barium ferrite film was not crystallized, it was post-annealed at 800 degreesC for 5 h in air. The c-axis of crystallized barium ferrite was oriented perpendicular to the film surface that was caused by the effect of the AIN underlayer. (C) 2001 Elsevier Science B.V. All rights reserved.