Development of an optimal measuring device selection system using neural networks

被引：1
|
作者：
Son, S [1 ]
Park, H [1 ]
Lee, KH [1 ]
机构：
[1] Kwangju Inst Sci & Technol KJIST, Kwangju 500712, South Korea
来源：
INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH | 2003年 / 41卷 / 17期
关键词：
D O I：
10.1080/0020754031000095149
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
An optimal measuring device selection system using neural networks is proposed. There are two major steps. First, the measuring information such as curvature, normal, type of surface, edge and facet approximation is extracted from the computer-aided design model. Second, the best suitable measuring device is determined using the neural network system based on the knowledge of the measuring parameters and measuring resources. An example of machine selection is implemented to evaluate the performance of the system.
引用
收藏
页码：4133 / 4151
页数：19
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