Deep Metric Learning for Color Differences

被引:0
|
作者
Zolotarev, Fedor [1 ]
Kaarna, Arto [1 ]
机构
[1] Lappeenranta Univ Technol, Sch Engn Sci, Machine Vis & Pattern Recognit Lab, POB 20, FI-53851 Lappeenranta, Finland
关键词
DISTANCE;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Numerous attempts have been made to define a color space and a color distance metric that would closely resemble the human color vision. The uniformity has been the main challenge, the human vision system is more sensitive to some colors while less sensitive to others. A distance given by an ideal metric would match the color difference seen by the human vision system. This study attempts to define such a metric utilizing the spectral data and the available information on the distinguishable colors. Deep neural networks are used in metric learning for modeling the color space and the metric. The resulting metric is then tested against the standard CIEDE2000 metric. DNNs are also used to project spectral data onto a new color space. The results indicate that the new color space with the Euclidean metric is more perceptually uniform than the standard LAB color space with the CIEDE2000 metric. The new metric enables better understanding about the human vision system and measuring the color differences.
引用
收藏
页数:6
相关论文
共 50 条
  • [1] Modeling Perceptual Color Differences by Local Metric Learning
    Perrot, Michael
    Habrard, Amaury
    Muselet, Damien
    Sebban, Marc
    COMPUTER VISION - ECCV 2014, PT V, 2014, 8693 : 96 - 111
  • [2] Learning a Deep Color Difference Metric for Photographic Images
    Chen, Haoyu
    Wang, Zhihua
    Yang, Yang
    Sun, Qilin
    Ma, Kede
    2023 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2023, : 22242 - 22251
  • [3] Deep Metric Learning to Rank
    Cakir, Fatih
    He, Kun
    Xia, Xide
    Kulis, Brian
    Sclaroff, Stan
    2019 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR 2019), 2019, : 1861 - 1870
  • [4] Deep Meta Metric Learning
    Chen, Guangyi
    Zhang, Tianren
    Lu, Jiwen
    Zhou, Jie
    2019 IEEE/CVF INTERNATIONAL CONFERENCE ON COMPUTER VISION (ICCV 2019), 2019, : 9546 - 9555
  • [5] Deep Transfer Metric Learning
    Hu, Junlin
    Lu, Jiwen
    Tan, Yap-Peng
    Zhou, Jie
    IEEE TRANSACTIONS ON IMAGE PROCESSING, 2016, 25 (12) : 5576 - 5588
  • [6] Deep Factorized Metric Learning
    Wang, Chengkun
    Zheng, Wenzhao
    Li, Junlong
    Zhou, Jie
    Lu, Jiwen
    2023 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, CVPR, 2023, : 7672 - 7682
  • [7] Guided Deep Metric Learning
    Gonzalez-Zapata, Jorge
    Reyes-Amezcua, Ivan
    Flores-Araiza, Daniel
    Mendez-Ruiz, Mauricio
    Ochoa-Ruiz, Gilberto
    Mendez-Vazquez, Andres
    2022 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION WORKSHOPS, CVPRW 2022, 2022, : 1480 - 1488
  • [8] Deep Transfer Metric Learning
    Hu, Junlin
    Lu, Jiwen
    Tan, Yap-Peng
    2015 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2015, : 325 - 333
  • [9] Introspective Deep Metric Learning
    Wang, Chengkun
    Zheng, Wenzhao
    Zhu, Zheng
    Zhou, Jie
    Lu, Jiwen
    IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2024, 46 (04) : 1964 - 1980
  • [10] Deep Compositional Metric Learning
    Zheng, Wenzhao
    Wang, Chengkun
    Lu, Jiwen
    Zhou, Jie
    2021 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, CVPR 2021, 2021, : 9316 - 9325