Processing of experimental reflectivity data within the REFLAN software package

被引：0
|
作者：
Samoilenko, II
Konovalov, OV
Feigin, LA
Shchedrin, BM
Yanusova, LG
机构：
[1] Russian Acad Sci, AV Shubnikov Crystallog Inst, Moscow 117333, Russia
[2] Moscow MV Lomonosov State Univ, Moscow 119899, Russia
来源：
CRYSTALLOGRAPHY REPORTS | 1999年 / 44卷 / 02期
关键词：
D O I：
暂无
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
The search for the optimum model of the structure of a layered medium based on experimental reflectivity data is considered. A new modification of the successive-descent method is developed for minimizing the functional describing the discrepancy between the observed and the calculated reflectivity profiles. The significance of the model parameters is established as a result of the test of simple statistical hypotheses. The efficiency of the method developed is illustrated on an experimental reflectivity profile measured earlier by Wiesler and Majkrzhak [2].
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页码：310 / 318
页数：9
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