共 35 条
- [1] Analyses of geological materials for boron by secondary ion mass spectrometry BORON, 1996, 33 : 789 - 803
- [2] The development of standard reference material 2137 - A boron implant in silicon standard for secondary ion mass spectrometry SEMICONDUCTOR CHARACTERIZATION: PRESENT STATUS AND FUTURE NEEDS, 1996, : 382 - 382