An IoT Inspired Semiconductor Reliability Test System Integrated with Data-Mining Applications

被引：0
|
作者：
Tang, Tyler Junyao [1 ]
Chung, Andrew [1 ]
Zhao, Atman [1 ]
Kang, Randy [1 ]
Zhang, Mark [1 ]
Chien, Kary [1 ]
Yang, Jungang [2 ]
Zhang, Jie [2 ]
机构：
[1] Semicond Mfg Int Corp, Qual & Reliabil Engn, Shanghai, Peoples R China
[2] Shanghai Jiao Tong Univ, Inst Intelligent Mfg & Informat Engn, Shanghai, Peoples R China
来源：
PROCEEDINGS OF 2016 2ND INTERNATIONAL CONFERENCE ON CLOUD COMPUTING AND INTERNET OF THINGS (CCIOT) | 2016年
关键词：
Semiconductor reliability test; industrial; 4.0; software system design; data mining; Bayesian reliability;
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Reliability assessment is a key step in ensuring the quality of a product. As semiconductor technology continues to evolve, the reliability test process also complicates, involving engineers and technical assistants responsible for different test tasks. In this paper, we propose a design of a comprehensive Reliability Management and Index System that integrates online test requests, database management and test data analysis. In addition, the resultant big data collected by the system inspire potential data-mining applications for new reliability data-analysis approaches.
引用
收藏
页码：111 / 114
页数：4
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