Barium ferrite thin-film recording media

被引:73
|
作者
Sui, XY
Scherge, M
Kryder, MH
Snyder, JE
Harris, VG
Koon, NC
机构
[1] UNIV PITTSBURGH,CTR DATA STORAGE SYST,PITTSBURGH,PA 15213
[2] SEAGATE TECHNOL,BLOOMINGTON,MN 55435
[3] USN,RES LAB,WASHINGTON,DC 20375
关键词
D O I
10.1016/0304-8853(95)00722-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Both longitudinal and perpendicular barium ferrite thin films are being pursued as overcoatless magnetic recording media. In this paper, prior research on thin-film Ba ferrite is reviewed and the most recent results are presented. Self-textured high-coercivity longitudinal Ba ferrite thin films have been achieved using conventional rf diode sputtering. Microstructural studies show that c-axis in-plane oriented grains have a characteristic acicular shape, while c-axis perpendicularly oriented grains have a platelet shape. Extended X-ray absorption fine structure (EXAFS) measurements indicate that the crystal orientations are predetermined by the structural anisotropy in the as-sputtered 'amorphous. state. Recording tests on 1500 Oe coercivity longitudinal Ba ferrite disks show performance comparable with that of a 1900 Oe Co alloy disk. To further improve the recording performance, both grain size and aspect ratio need to be reduced. Initial tribological tests indicate high hardness of Ba ferrite thin films. However, surface roughness needs to be reduced. For future ultrahigh-density contact recording, it is believed that perpendicular recording may be used. A thin Pt underlayer has been found to be capable of producing Ba ferrite thin films with excellent c-axis perpendicular orientation.
引用
收藏
页码:132 / 139
页数:8
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